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Current issue:
June 2010
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Events/Reviews:
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Editor-in-Chief
IDA ERŽEN (Slovenia) |
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Honorary Editor
†MIROSLAV KALIŠNIK (Slovenia) |
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Associate Editors
YANNICK ANGUY (France)
image analysis; applications
YRJÖ COLLAN (Finland)
applied stereology; quantitative pathology
WERNER NAGEL (Germany)
stereology; stochastic geometry and statistics
LESZEK WOJNAR (Poland)
image analysis; materials science |
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| Editorial board |
J. Angulo (France)
J. Basgen (USA)
V. Beneš (Czech Republic)
V. Capasso (Italy)
J.M. Chaix (France)
E. Decenciere (France)
P. Dockery (Ireland)
B.M. Efros (Ukraine)
M. García Fiñana (Spain)
J. Grum (Slovenia)
D. Jeulin (France)
M. Kiderlen (Denmark)
J. Komenda (Sweden)
L. Kubínová (Czech Republic)
B. Likar (Slovenia)
J. Lucocq (United Kingdom)
T. Mayhew (United Kingdom)
J.R. Nyengaard (Denmark)
J. Ohser (Germany)
D.E. Oorshot (New Zealand)
E. Pirard (Belgium)
W. Sampson (United Kingdom)
K. Schladitz (Germany)
Y. Tang (China)
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